By John C. H. Spence
This new fourth version of the normal textual content on atomic-resolution transmission electron microscopy (TEM) keeps past fabric at the basics of electron optics and aberration correction, linear imaging thought (including wave aberrations to 5th order) with partial coherence, and multiple-scattering thought. additionally preserved are up to date past sections on useful tools, with unique step by step bills of the approaches had to receive the best quality photos of atoms and molecules utilizing a latest TEM or STEM electron microscope. purposes sections were up to date - those comprise the semiconductor undefined, superconductor examine, stable country chemistry and nanoscience, and metallurgy, mineralogy, condensed subject physics, fabrics technological know-how and fabric on cryo-electron microscopy for structural biology. New or increased sections were additional on electron holography, aberration correction, field-emission weapons, imaging filters, super-resolution equipment, Ptychography, Ronchigrams, tomography, snapshot quantification and simulation, radiation harm, the size of electron-optical parameters, and detectors (CCD cameras, photograph plates and direct-injection sturdy kingdom detectors). the speculation of Scanning transmission electron microscopy (STEM) and Z-contrast are handled comprehensively. Chapters are dedicated to linked thoughts, comparable to energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. resources of software program for photo interpretation and electron-optical layout are given.